Recent Advances in Anomaly Identification for IoT Devices Using Machine and Deep Learning Models. Journal of Data Analysis and Critical Management, [S. l.], v. 2, n. 01, p. 37–47, 2026. DOI: 10.64235/6wy0d584. Disponível em: https://jdacm.com/index.php/jdacm/article/view/107. Acesso em: 28 mar. 2026.